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* 1.(BIST) The technique of designing circuits with additional logic which can be used to test proper operation of the primary (functional) logic.
(1995-02-14)
English Related Words* a shadow of his former self
* abbreviated test language for avionics systems
* ability test
* abrams slump test
* abrasion test
* abrasion wear test machine
* accelerated aging test
* accelerated test
* accelerated test marketing
* acceptance test
* acceptance, test or launch language
* achievement test
* acid resistance test
* acid test
* acid test ratio
(1995-02-14)
English Related Words* a shadow of his former self
* abbreviated test language for avionics systems
* ability test
* abrams slump test
* abrasion test
* abrasion wear test machine
* accelerated aging test
* accelerated test
* accelerated test marketing
* acceptance test
* acceptance, test or launch language
* achievement test
* acid resistance test
* acid test
* acid test ratio